Title:
INFORMATION ANALYSIS DEVICE, INFORMATION ANALYSIS METHOD, AND INFORMATION ANALYSIS PROGRAM
Document Type and Number:
WIPO Patent Application WO/2019/053827
Kind Code:
A1
Abstract:
In this information analysis device, a unit model generation unit 81 generates a learning model for each of partial prediction targets. An estimated error calculation unit 82 calculates an estimated error along a time axis for a case in which the value of a partial prediction target is estimated using a learning model. A set generation unit 83 uses the estimated errors as input to generate a set of groups by using the degree of similarity on a time axis between the estimated errors regarding one learning model and the estimated errors regarding another learning model as a basis to group partial prediction targets corresponding to the one learning model and partial prediction targets corresponding to the other learning model. A partial sum model generation unit 84 generates a learning model in which the sum of the partial prediction targets included in the groups serves as an objective variable. A prediction target calculation unit 85 calculates a value for a prediction target from predicted values for the groups calculated using the learning model.
Inventors:
MOTOHASHI YOUSUKE (JP)
UMEZU KEISUKE (JP)
WASHIDA AZUSA (JP)
NAKATOMI MASASHI (JP)
UMEZU KEISUKE (JP)
WASHIDA AZUSA (JP)
NAKATOMI MASASHI (JP)
Application Number:
PCT/JP2017/033107
Publication Date:
March 21, 2019
Filing Date:
September 13, 2017
Export Citation:
Assignee:
NEC CORP (JP)
International Classes:
G06Q10/04
Foreign References:
| JP2006085645A | 2006-03-30 | |||
| JPH10240799A | 1998-09-11 | |||
| JP2017094097A | 2017-06-01 | |||
| JP2013196037A | 2013-09-30 |
Attorney, Agent or Firm:
IWAKABE Fuyuki et al. (JP)
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