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Title:
INFORMATION PROCESSING DEVICE AND MACHINING DEFECT IDENTIFICATION METHOD
Document Type and Number:
WIPO Patent Application WO/2018/225159
Kind Code:
A1
Abstract:
An information processing device (1) is characterized by comprising a machining defect identifying unit (13) that identifies, on the basis of an image feature value (40) calculated from image data capturing a workpiece after machining, a machining defect in the workpiece and that identifies, on the basis of a program feature value (41) calculated from a machining program (2) for machining a workpiece and the image feature value (40), the section of the machining program (2) where the operation for machining the machining defect is described.

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Inventors:
NISHIWAKI KENJI (JP)
Application Number:
PCT/JP2017/021000
Publication Date:
December 13, 2018
Filing Date:
June 06, 2017
Export Citation:
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Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
B23Q15/00; B23Q17/24; G05B19/18
Foreign References:
JPH10133728A1998-05-22
JP2010058264A2010-03-18
JPH04201050A1992-07-22
Attorney, Agent or Firm:
TAKAMURA, Jun (JP)
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