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Patent Searching and Data


Title:
INFRARED LIGHT ADJUSTMENT METHOD AND POSITION DETECTION SYSTEM
Document Type and Number:
WIPO Patent Application WO/2016/063323
Kind Code:
A1
Abstract:
An adjustment method for adjusting the direction of infrared light projected, so as to pass over a display image, from a projection device that is rotatable about orthogonal first and second axes as axes of rotation, the method involving: arranging the projection device so that a plane containing the first axis and a line perpendicular to the upper edge or lower edge of the display image is orthogonal to a plane representing the display image; displaying a first image representing a first target on said line; rotating the projection device with the second axis as the axis of rotation, so that an irradiation position of the infrared light onto an indicator in the first image, represented by a photographic image taken of a state of irradiation by the infrared light of the indicator indicating the first target, is aligned with the position of the first target on the first image; displaying a second image representing a second target in place of the first image at a location different from said line; and rotating the projection device with the first axis as the axis of rotation, so that an irradiation position of the infrared light onto an indicator in the second image, represented by a photographic image taken of a state of irradiation of the infrared light on an indicator indicating a second target, is aligned with the position of the second target on the second image.

Inventors:
INOUE KAZUYA (JP)
Application Number:
PCT/JP2014/077795
Publication Date:
April 28, 2016
Filing Date:
October 20, 2014
Export Citation:
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Assignee:
NEC DISPLAY SOLUTIONS LTD (JP)
International Classes:
G06F3/042; G03B21/14; G06F3/041
Domestic Patent References:
WO2013104061A12013-07-18
Foreign References:
JP2014149740A2014-08-21
JP2014132435A2014-07-17
JP2011237361A2011-11-24
Attorney, Agent or Firm:
MIYAZAKI, Teruo et al. (JP)
Akio Miyazaki (JP)
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