Title:
INK EJECTION QUANTITY MEASUREMENT/ADJUSTMENT METHOD, INK EJECTION QUANTITY MEASUREMENT/ADJUSTMENT DEVICE, PANEL MANUFACTURING SYSTEM FOR ORGANIC EL DISPLAY PANEL, ORGANIC EL DISPLAY PANEL MANUFACTURING METHOD, INK, AND ORGANIC EL DISPLAY PANEL MANUFACTURED USING INK
Document Type and Number:
WIPO Patent Application WO/2022/124242
Kind Code:
A1
Abstract:
A measurement/adjustment method including at least a measurement method for measuring the quantity of ink ejected from an ink ejection head, wherein in said measurement method, ink is ejected from the ink ejection head onto a substrate, an image of the ink that was ejected onto the substrate is acquired, the quantity of ink ejected from the ink ejection head is derived on the basis of information obtained from the image, and the ink that was ejected onto the substrate is maintained, after a prescribed time period has passed since being ejected from the ink ejection head, in a quantity that is a constant proportion of the quantity of ink that was ejected from the ink ejection head.
Inventors:
FUKUDA TOSHIO (JP)
Application Number:
PCT/JP2021/044590
Publication Date:
June 16, 2022
Filing Date:
December 03, 2021
Export Citation:
Assignee:
MITSUBISHI CHEM CORP (JP)
International Classes:
B05D1/26; B05D3/00; B05D7/24; H01L27/32; H01L51/50; H05B33/10
Foreign References:
| JP2012187500A | 2012-10-04 | |||
| JP2016166286A | 2016-09-15 | |||
| JP2005147829A | 2005-06-09 | |||
| JP2008282011A | 2008-11-20 | |||
| JP2012187497A | 2012-10-04 |
Attorney, Agent or Firm:
EIKOH PATENT FIRM, P.C. (JP)
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