Title:
INK SATURATION AMOUNT MEASUREMENT METHOD AND DETERMINATION METHOD, AND METHOD FOR PREPARING INK PATCH CHART
Document Type and Number:
WIPO Patent Application WO/2016/158033
Kind Code:
A1
Abstract:
Provided is an ink patch chart with which it is possible to accurately determine the ink saturation amount of ink that is curable with radiation energy rays such as UV or electron rays. The saturation amount of the ink that is curable with radiation energy rays such as UV or electron rays is determined on the basis of the state of the ink coating film on the surface of a patch on an ink patch chart. An ink diffusion prevention pattern for preventing ink from diffusing to the surroundings is drawn on the ink patch chart. In the ink diffusion prevention pattern, before drawing the patch, a guard ring is drawn using the ink that is curable with radiation energy rays in the area surrounding the patch drawing area, the guard ring is configured by being cured with the radiation energy rays, and the patch is drawn in the region surrounded by the guard ring. Also, before drawing the patch, a base pattern is printed at a low density in a prescribed region in the central portion of the patch, the base pattern is configured by being cured with the radiation energy rays, and the patch is drawn on the base pattern.
Inventors:
TSUKUI YOSHIYUKI (JP)
ASAMI YOSHIO (JP)
ASAMI YOSHIO (JP)
Application Number:
PCT/JP2016/054233
Publication Date:
October 06, 2016
Filing Date:
February 15, 2016
Export Citation:
Assignee:
MUTOH IND LTD (JP)
International Classes:
B41J2/01; B41J2/525
Foreign References:
| JP2005231179A | 2005-09-02 | |||
| JP2012254613A | 2012-12-27 | |||
| JP2003500262A | 2003-01-07 | |||
| JP2016010973A | 2016-01-21 |
Attorney, Agent or Firm:
NISHIJIMA AYAO (JP)
Ayao Nishijima (JP)
Ayao Nishijima (JP)
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