Title:
INPUT-VOLTAGE ABNORMALITY DETECTION METHOD AND POWER SOURCE DEVICE
Document Type and Number:
WIPO Patent Application WO/2017/022329
Kind Code:
A1
Abstract:
This abnormality detection method for single-phase AC input voltage is executed by a control unit having a phase-locked loop function. In the method: a simulated voltage waveform phase-locked to input voltage is sequentially generated by using a phase-locked loop; an instantaneous value of the input voltage is compared with the generated simulated voltage waveform, within a time before the simulated voltage waveform is next updated; and when a state where the instantaneous value of the input voltage is along the simulated voltage waveform is shifted to a state where the instantaneous value of the input voltage is not along the simulated voltage waveform, the input voltage is determined to be abnormal.
More Like This:
Inventors:
URAKAWA FUMIO (JP)
AKITA TETSUO (JP)
TAKESHITA KOICHI (JP)
AKITA TETSUO (JP)
TAKESHITA KOICHI (JP)
Application Number:
PCT/JP2016/066940
Publication Date:
February 09, 2017
Filing Date:
June 07, 2016
Export Citation:
Assignee:
SUMITOMO ELECTRIC INDUSTRIES (JP)
International Classes:
G01R19/165; H02H3/24; H02J9/06
Foreign References:
| JP2009092504A | 2009-04-30 | |||
| JP2006242739A | 2006-09-14 | |||
| JPH0478572U | 1992-07-08 | |||
| JPH01153969A | 1989-06-16 | |||
| JP2008125169A | 2008-05-29 | |||
| JPS61189468A | 1986-08-23 | |||
| JP2006067728A | 2006-03-09 |
Attorney, Agent or Firm:
SUNCREST PATENT AND TRADEMARK ATTORNEYS (JP)
Download PDF: