Title:
INSPECTING DEVICE AND INSPECTING METHOD
Document Type and Number:
WIPO Patent Application WO/2018/105541
Kind Code:
A1
Abstract:
[Problem] To provide an inspecting device and an inspecting method with which it is possible to reduce a measuring time for one high-frequency module and to reduce manufacturing costs significantly.
[Solution] An inspecting device 100 is provided with: a holding unit 30 capable of holding a high-frequency module 70; an antenna unit 10 which receives and/or transmits a test signal capable of being transmitted or received by the high-frequency module 70; and a parabolic reflector plate 20 which reflects the test signal in a predetermined direction. The holding unit 30 is provided with a holding surface 31 for disposing a plurality of the high-frequency modules 70 side-by-side. The reflector plate 20 is disposed in such a way as to face the holding surface 31, and the antenna unit 10 is disposed at a focal point position 21 of the reflector plate 20.
Inventors:
WATANABE FUMIO (JP)
Application Number:
PCT/JP2017/043416
Publication Date:
June 14, 2018
Filing Date:
December 04, 2017
Export Citation:
Assignee:
ALPS ELECTRIC CO LTD (JP)
International Classes:
G01S7/40; H04B17/00
Foreign References:
| US4521780A | 1985-06-04 | |||
| JPH1039017A | 1998-02-13 | |||
| JP2003315440A | 2003-11-06 | |||
| JP2010266423A | 2010-11-25 |
Attorney, Agent or Firm:
NOZAKI, Teruo (JP)
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