Title:
INSPECTION APPARATUS AND INSPECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2014/167838
Kind Code:
A1
Abstract:
An inspection apparatus configured to inspect each wire of an object to be inspected in which a plurality of x-axis wires and a plurality of y-axis wires are arranged perpendicular to each other, each x-axis wire provided with an x-axis display wire and an x-axis tab wire, each y-axis wire provided with a y-axis display wire and a y-axis tab wire, the inspection apparatus provided with: a power supply device configured to supply an AC signal to the wire as an inspection object; a connecting device configured to be in conductive contact with the tab wire of the wire as the inspection object and to transmit the AC signal; a first detecting device disposed in a non-contact manner at one end of the display wire of the wire as the inspection object and conductively connected to one end of the power supply device; a second detecting device disposed in the non-contact manner and opposed to the display wire of the wire as the inspection object and conductively connected to the one end of the power supply device; and a determining device configured to determine quality of the wire as the inspection object on the basis of results of the first detecting device and the second detecting device.
Inventors:
TAKAHASHI TADASHI (JP)
Application Number:
PCT/JP2014/002005
Publication Date:
October 16, 2014
Filing Date:
April 08, 2014
Export Citation:
Assignee:
NIDEC READ CORP (JP)
International Classes:
G01R31/02
Foreign References:
| JP2002365325A | 2002-12-18 | |||
| JP2011220916A | 2011-11-04 | |||
| JPS63226688A | 1988-09-21 | |||
| JP2001084904A | 2001-03-30 |
Attorney, Agent or Firm:
KITAMURA, Hideaki (338 Kuzetonoshiro-cho, Minami-ku, Kyoto-sh, Kyoto 05, JP)
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