Title:
INSPECTION APPARATUS AND INSPECTION SYSTEM
Document Type and Number:
WIPO Patent Application WO/2016/204269
Kind Code:
A1
Abstract:
Provided are an inspection apparatus and an inspection system which control the omission of data from inspection results. This X-ray inspection apparatus (100) is provided with an inspection part (176), an HDD (174), and an inspection control part (178). The inspection part (176) inspects articles. The HDD (174) stores data relating to inspection results obtained from the inspection part (176). The inspection control part (178) stops the inspection performed by the inspection part (176) when a variable (dcap) indicating the cumulative capacity for data in the HDD (174) reaches a constant (Ths) that indicates a preset stop threshold value.
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Inventors:
CHIBA TOSHIYUKI (JP)
ISHIDA TETSUYA (JP)
IWAI ATSUSHI (JP)
ISHIDA TETSUYA (JP)
IWAI ATSUSHI (JP)
Application Number:
PCT/JP2016/068082
Publication Date:
December 22, 2016
Filing Date:
June 17, 2016
Export Citation:
Assignee:
ISHIDA SEISAKUSHO (JP)
International Classes:
G01N23/04; G01N23/18
Foreign References:
| JP2011043363A | 2011-03-03 | |||
| JP3180313U | 2012-12-13 | |||
| JPH0947447A | 1997-02-18 |
Attorney, Agent or Firm:
Shinjyu Global IP (JP)
fresh green -- a global IP patent business corporation (JP)
fresh green -- a global IP patent business corporation (JP)
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