INSPECTION ASSISTANCE DEVICE, INSPECTION ASSISTANCE SYSTEM, METHOD OF ASSISTING INSPECTION, AND INSPECTION ASSISTANCE PROGRAM

WIPO Patent Application WO/2012/046726

A1

An inspection assistance device (100) is provided with a camera (20) which picks up an image of each measurement device; a display device (34) which displays assistance information assisting with the inspection work by the person inspecting; a storage unit (31) which stores inspection information including identification information for each measurement device that should be measured; and a processing unit (32) which identifies the respective identification information and a measurement value for each measurement device on the basis of the image information for each measurement device picked up by the camera (20), stores measurement values and identification information in the storage device (31) while associating each measurement value with the respective identification information, and furthermore, when it is determined that among the measurement devices there is an unmeasured measurement device, which is not yet stored in the storage device (31), causes the display unit (34) to display the identification information of the unmeasured measurement device as assistance information.

NAKAO KENGO (JP)
HARADA MINORU (JP)

PCT/JP2011/072870

April 12, 2012

October 04, 2011

Click for automatic bibliography generation  

NIPPON STEEL CORP (JP)
NAKAO KENGO (JP)
HARADA MINORU (JP)

G05B23/02

JPH0869595A	1996-03-12
JPH0877484A	1996-03-22
JPS61231694A	1986-10-15
JP2002245188A	2002-08-30
JP2006302016A	2006-11-02
JP2003173196A	2003-06-20

SHIGA Masatake et al. (JP)
Masatake Shiga (JP)

View/Download PDF      PDF Help

Previous Patent: DISPLAY PANEL AND DISPLAY DEVICE PROVIDED WITH SAME

Next Patent: METHOD FOR PRODUCING VIRUS VECTOR