Title:
INSPECTION CHIP, AND INSPECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2014/050947
Kind Code:
A1
Abstract:
Provided is an inspection chip and an inspection device, whereby it is possible to inspect multiple objects while suppressing the entire length of a liquid flow path to a minimum. A first flow path (100) is provided to the front surface (25) of an inspection chip (2), the first flow path (100) containing a specimen amount measurement unit (114) for measuring the amount of a specimen, reagent amount measurement units (134, 154) for measuring the amount of a reagent, and a first storage unit (172) for storing and measuring a mixed liquid of the specimen and the reagent. A second flow path is provided to the rear surface (26) of the inspection chip (2), the second flow path containing a specimen amount measurement unit, two reagent amount measurement units, and a second storage unit. The first flow path (100) and the second flow path have the same shape when light is projected thereto in the front-rear direction.
Inventors:
OSHIKA YUMIKO (JP)
Application Number:
PCT/JP2013/076015
Publication Date:
April 03, 2014
Filing Date:
September 26, 2013
Export Citation:
Assignee:
BROTHER IND LTD (JP)
International Classes:
G01N35/08; C12M1/34; G01N35/00; G01N35/02; G01N37/00
Foreign References:
| JP2009133805A | 2009-06-18 | |||
| JP2003130883A | 2003-05-08 |
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