INSPECTION DEVICE, BLISTER PACKAGING MACHINE, AND BLISTER SHEET MANUFACTURING METHOD

Title:

INSPECTION DEVICE, BLISTER PACKAGING MACHINE, AND BLISTER SHEET MANUFACTURING METHOD

Document Type and Number:

WIPO Patent Application WO/2020/075375

Kind Code:

A1

Abstract:

Provided are an inspection device, blister packaging machine, and blister sheet manufacturing method that make it possible to enhance the inspection accuracy of inspection in which spectroscopic analysis is used to identify contamination with a different type of product. This inspection device 22 comprises an illumination device 52 capable of emitting near-infrared light onto a tablet 5 inserted into a pocket part 2 of a conveyed container film 3 and an image capturing device 53 that is capable of dispersing the near-infrared light reflected by the tablet 5 and capturing a spectral image of the reflected light. Spectral data for a plurality of points on the tablet 5 is acquired on the basis of the spectral image captured by the imaging device 53. A group of the plurality of points of spectral data having the most concentrated brightness values for a prescribed wavelength component is selected as a concentrated spectral data group. The inspection device inspects for contamination with a different type of product by carrying out prescribed analysis of the tablet 5 on the basis of the concentrated spectral data group.

Inventors:

TAGUCHI YUKIHIRO (JP)

Application Number:

PCT/JP2019/030669

Publication Date:

April 16, 2020

Filing Date:

August 05, 2019

Export Citation:

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Assignee:

CKD CORP (JP)

International Classes:

G01N21/359; G01N21/3563; G01N21/85

Domestic Patent References:

WO2013002291A1	2013-01-03
WO2005038443A1	2005-04-28

Foreign References:

JPS6329668B2	1988-06-14
JP2018021894A	2018-02-08
US20020108892A1	2002-08-15

Other References: