INSPECTION DEVICE AND CASTING SYSTEM

Title:

INSPECTION DEVICE AND CASTING SYSTEM

Document Type and Number:

WIPO Patent Application WO/2018/216495

Kind Code:

A1

Abstract:

This inspection device is for inspecting the appearance of an object. The inspection device is provided with: an imaging device for imaging the object from a first direction, an illumination unit for irradiating the object with light using a first irradiation pattern in which light is irradiated from a first position and a second irradiation pattern in which light is irradiated from a second position different from the first position, and a controller for acquiring a first inspection image by causing the imaging device to image the object when the object is irradiated with light using the first irradiation pattern, acquiring a second inspection image by causing the imaging device to image the object when the object is irradiated with light using the second irradiation pattern, and inspecting the appearance of the object on the basis of the first inspection image, second inspection image, and a preset reference image. The first position and second position overlap when viewed from the first direction.

Inventors:

OTA KAZUHIRO (JP)
SEKI TSUTOMU (JP)
ICHINO YOSHIMITSU (JP)
IWASAKI JUNICHI (JP)
SONOHARA TAKESHI (JP)
KAWAKAMI RYUICHI (JP)
AOKI TATSUYA (JP)

Application Number:

PCT/JP2018/018190

Publication Date:

November 29, 2018

Filing Date:

May 10, 2018

Export Citation:

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Assignee:

SINTOKOGIO LTD (JP)

International Classes:

G01N21/84; B22C9/00; B22D47/02; G01N21/88

Foreign References:

JP2007212544A	2007-08-23
JPH04329344A	1992-11-18
JP2016050864A	2016-04-11
JP2004109094A	2004-04-08
JP2015121521A	2015-07-02
JP2007292641A	2007-11-08
JP2005164488A	2005-06-23
JPH02165842A	1990-06-26
JPH0839194A	1996-02-13
JP2003117635A	2003-04-23
JP2015068668A	2015-04-13

Other References: