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Patent Searching and Data


Title:
INSPECTION DEVICE, IMAGE DISCRIMINATING DEVICE, DISCRIMINATING DEVICE, INSPECTION METHOD, AND INSPECTION PROGRAM
Document Type and Number:
WIPO Patent Application WO/2019/176990
Kind Code:
A1
Abstract:
The reliability of determination in which a discriminator is used is prevented from being impaired even when the discrimination performance of the discriminator deteriorates due to re-learning or additional learning. An inspection device pertaining to one aspect of the present invention holds both of a first discriminator before re-learning or additional learning, and a second discriminator after re-learning or additional learning. The numeric range of a second criterion of the second discriminator is set to be narrower than the numeric range of a first criterion of the first discriminator. When a second output value of the second discriminator satisfies the second criterion, the inspection device determines the acceptability of a product on the basis of the second output value of the second discriminator. However, when the second output value of the second discriminator does not satisfy the second criterion, the inspection device determines the acceptability of the product on the basis of a first output value of the first discriminator.

Inventors:
KURITA, Masashi (801 Minamifudodo-cho, Horikawahigashiiru, Shiokoji-dori, Shimogyo-ku, Kyoto-sh, Kyoto 30, 〒6008530, JP)
Application Number:
JP2019/010180
Publication Date:
September 19, 2019
Filing Date:
March 13, 2019
Export Citation:
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Assignee:
OMRON CORPORATION (801 Minamifudodo-cho, Horikawahigashiiru Shiokoji-dori, Shimogyo-ku, Kyoto-sh, Kyoto 30, 〒6008530, JP)
International Classes:
G06T7/00
Foreign References:
JP2011257805A2011-12-22
JP2018032071A2018-03-01
JP2017058833A2017-03-23
JP2015032119A2015-02-16
Attorney, Agent or Firm:
TACHIBANA, Kenji et al. (21st Floor, Nakanoshima Intes Bldg. 6-2-40, Nakanoshima, Kita-ku, Osaka-sh, Osaka 05, 〒5300005, JP)
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