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Patent Searching and Data


Title:
INSPECTION DEVICE AND INSPECTION METHOD EMPLOYING DEVICE
Document Type and Number:
WIPO Patent Application WO/2018/146658
Kind Code:
A1
Abstract:
The technical concept of the present invention provides an inspection device capable of precisely and rapidly inspecting the exterior of an inspection object, and an inspection method employing the inspection device. The inspection device comprises: a first stage for inspecting a first surface and/or a second surface of an inspection object, the first and second surfaces being opposite to each other; and a second stage for inspecting side surfaces between the first surface and the second surface, wherein a flipper, provided to the second stage so as to flip the inspection object, can stably transport the inspection object between one distal end of a flipper body to the opposite distal end thereof.

Inventors:
LEE HO JUN (KR)
Application Number:
PCT/IB2018/052439
Publication Date:
August 16, 2018
Filing Date:
April 09, 2018
Export Citation:
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Assignee:
KOH YOUNG TECH INC (KR)
International Classes:
G01N21/88; B65G15/14; B65G15/20; B65G15/22; B65G37/00; G06T7/00
Foreign References:
KR20140007509A2014-01-20
KR100783618B12007-12-07
KR20070088661A2007-08-29
JP2753445B21998-05-20
JPH0549730U1993-06-29
Attorney, Agent or Firm:
CHANG, Duck Soon (KR)
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