INSPECTION DEVICE AND INSPECTION METHOD FOR MEMBER HAVING FINE UNEVEN STRUCTURE ON SURFACE THEREOF, MANUFACTURING METHOD FOR MEMBER HAVING ANODIC ALUMINA LAYER ON SURFACE THEREOF, AND MANUFACTURING METHOD FOR OPTICAL FILM

Title:

Document Type and Number:

WIPO Patent Application WO/2013/047593

Kind Code:

A1

Abstract:

Provided are an inspection device and an inspection method which are capable of easily inspecting the shape of a fine uneven structure on the surface of anodic alumina and the thickness of the anodic alumina, and the like. This inspection device for anodic alumina is characterized by being provided with: an application means (22) for applying light to anodic alumina to be inspected; an image capturing means (24) for capturing an image of light that has passed through a polarization means; the polarization means (28) for polarizing the light applied from the application means; and an image processing means (26) for, on the basis of color information obtained from the image captured by the image capturing means, determining whether the state of the anodic alumina is good or not.

Inventors:

FUKUYAMA MITSUFUMI (JP)
ISHIMARU TERUTA (JP)
MATSUBARA YUUJI (JP)

Application Number:

PCT/JP2012/074726

Publication Date:

April 04, 2013

Filing Date:

September 26, 2012

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Assignee:

MITSUBISHI RAYON CO (JP)
FUKUYAMA MITSUFUMI (JP)
ISHIMARU TERUTA (JP)
MATSUBARA YUUJI (JP)

International Classes:

G01N21/88; G01B11/00

Domestic Patent References:

WO2011111669A1	2011-09-15
WO2011145625A1	2011-11-24
WO2011118596A1	2011-09-29

Foreign References:

JP2008249386A	2008-10-16
JP2003500665A	2003-01-07
JP2010122599A	2010-06-03

Attorney, Agent or Firm:

TSUJII Koichi et al. (JP)
辻居 Koichi (JP)

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Claims:

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