Title:
INSPECTION DEVICE, INSPECTION METHOD, POSITIONING METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2021/010181
Kind Code:
A1
Abstract:
This inspection device 1 comprises: a robot arm 31 for gripping that grips an inspection target object 7; a camera 43; a measurement position calculation unit 142 that calculates a measurement position 10 for the camera 43 relative to the inspection target object 7, on the basis of shape data 8 for the inspection target object 7; a trajectory generation unit 143 that generates a trajectory for the robot arm 31 for gripping, on the basis of the measurement position 10; a robot control unit 13 that controls the action of the robot arm 31 for gripping, on the basis of the trajectory, and positions the inspection target object 7; a measurement unit 15 that, after positioning, uses the camera 43 and measures the inspection target object 7; and an inspection unit 16 that inspects the inspection target object 7 on the basis of the measured data.
Inventors:
NISHI YUICHI (JP)
SOMEJI TAKAHIRO (JP)
SONODA MASASHI (JP)
NISHIMURA TAKAYOSHI (JP)
ENOMOTO ATSUKO (JP)
NAKASU NOBUAKI (JP)
SOMEJI TAKAHIRO (JP)
SONODA MASASHI (JP)
NISHIMURA TAKAYOSHI (JP)
ENOMOTO ATSUKO (JP)
NAKASU NOBUAKI (JP)
Application Number:
PCT/JP2020/026010
Publication Date:
January 21, 2021
Filing Date:
July 02, 2020
Export Citation:
Assignee:
HITACHI METALS LTD (JP)
International Classes:
B25J13/08; G01N21/88
Domestic Patent References:
| WO2015008373A1 | 2015-01-22 |
Foreign References:
| JP2018194542A | 2018-12-06 | |||
| JP2007248241A | 2007-09-27 | |||
| JP2007240434A | 2007-09-20 | |||
| JP2018004310A | 2018-01-11 | |||
| JP2015085493A | 2015-05-07 | |||
| JP2019002788A | 2019-01-10 | |||
| JP2008292430A | 2008-12-04 | |||
| JP2001255279A | 2001-09-21 | |||
| JP2017062154A | 2017-03-30 |
Attorney, Agent or Firm:
INOUE, Seiichi (JP)
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