Title:
INSPECTION DEVICE, INSPECTION METHOD, AND INSPECTION PROGRAM
Document Type and Number:
WIPO Patent Application WO/2015/080191
Kind Code:
A1
Abstract:
This invention provides an inspection device, an inspection method, and an inspection program that make it possible to mix two different liquids into a homogenous mixture. This inspection device rotates an inspection chip that has a mixing section inside which an analyte is mixed with a reagent as a result of centrifugal force from said rotation acting on the analyte and the reagent. A CPU in the inspection device rotates (S75) the inspection chip at a given velocity of revolution (Vc), then stops (S77) the rotation of the inspection chip in the direction of revolution, then rotates (S79) the inspection chip at a different velocity of revolution (Ve), and then stops (S81) the rotation of the inspection chip in the direction of revolution again.
Inventors:
OSHIKA YUMIKO (JP)
YOSHIMURA CHISATO (JP)
YOSHIMURA CHISATO (JP)
Application Number:
PCT/JP2014/081336
Publication Date:
June 04, 2015
Filing Date:
November 27, 2014
Export Citation:
Assignee:
BROTHER IND LTD (JP)
International Classes:
G01N35/00; G01N35/08; G01N37/00
Foreign References:
| JP2007232673A | 2007-09-13 | |||
| JP2009156765A | 2009-07-16 | |||
| JP2009264858A | 2009-11-12 |
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