Title:
INSPECTION DEVICE, INSPECTION METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2018/110112
Kind Code:
A1
Abstract:
This inspection device has: an image acquisition unit for acquiring a light emission surface image that is an image obtained by capturing a light emission surface of a surface light source device; an inspection unit for setting an inspection range at a position where defects in the light emission surface image can appear, detecting, from the inspection range, a bright region that is a region brighter than a lower limit threshold, calculating an evaluation value for evaluating both the size of the bright region and the brightness of the bright region, and determining the presence/absence of a defect on the basis of the evaluation value; and an output unit for outputting information acquired by the inspection unit.
Inventors:
KONISHI YOSHINORI (JP)
Application Number:
PCT/JP2017/038687
Publication Date:
June 21, 2018
Filing Date:
October 26, 2017
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
G01M11/00; F21S2/00; G02F1/13; G02F1/13357; G06T1/00; F21Y115/10
Foreign References:
| JP2005207808A | 2005-08-04 | |||
| JP2015042942A | 2015-03-05 | |||
| US20090015825A1 | 2009-01-15 |
Other References:
See also references of EP 3557217A4
Attorney, Agent or Firm:
SEKINE, Takehiko et al. (JP)
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