Title:
INSPECTION DEVICE, INSPECTION METHOD, TRAINED MODEL GENERATING DEVICE, INSPECTION PROGRAM, AND TRAINED MODEL GENERATING PROGRAM
Document Type and Number:
WIPO Patent Application WO/2023/153282
Kind Code:
A1
Abstract:
The present invention improves reliability of inspection of electronic parts. An inspection device (2) calculates an estimation value (Rse) of a measured value of alternating current resistance, using a trained model (35) that causes a computer to function so as to calculate a measured value (Rs) of alternating current resistance of a measurement object measured by a two-terminal method, on the basis of a measured value (Rdc4) of direct current resistance of the measurement object measured by a four-terminal method and a measured value (Rdc2) of direct current resistance of the measurement object measured by the two-terminal method.
Inventors:
KOBAYASHI MASASHI (JP)
Application Number:
PCT/JP2023/003157
Publication Date:
August 17, 2023
Filing Date:
February 01, 2023
Export Citation:
Assignee:
HIOKI ELECTRIC WORKS (JP)
International Classes:
G01R27/26; G01R27/08; G01R35/00
Domestic Patent References:
| WO2016147722A1 | 2016-09-22 |
Foreign References:
| JP2019086460A | 2019-06-06 | |||
| JP2017096733A | 2017-06-01 |
Attorney, Agent or Firm:
EINSEL Felix-Reinhard et al. (JP)
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