Title:
INSPECTION DEVICE AND INSPECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2014/091913
Kind Code:
A1
Abstract:
In order to make it as easy as possible to identify the deformation start location or the deformation end location of a flexible component in a force waveform concerning an assembly to which the elastic component is mounted, an inspection device (100) is provided with: a force waveform detection system (a robot (2), a force acquisition unit (3), and a position acquisition unit (5)) that applies a load in the direction in which the flexible component acts to a workpiece having the flexible component mounted thereto and acquires a force waveform that describes the relationship between the load and a displacement amount; an inspection parameter designation unit (9) that serves as a reception unit for receiving the input of a given designated point (PM point) during a process for deforming the flexible component from among the force waveforms acquired by the force waveform detection system; and an inspection unit (8) that calculates the local slope of the force waveform at the designated point and, on the basis of the local slope in the calculated designated point, identifies a physical characteristic change point that includes the deformation start location or the deformation end location of the flexible component in the force waveform.
Inventors:
LIU ZHENGYONG (JP)
SHIRATSUCHI KOJI (JP)
NAGAOKA RINTARO (JP)
SHIRATSUCHI KOJI (JP)
NAGAOKA RINTARO (JP)
Application Number:
PCT/JP2013/081631
Publication Date:
June 19, 2014
Filing Date:
November 25, 2013
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
G01M13/00; G01N3/00
Foreign References:
| JPS6180091A | 1986-04-23 | |||
| JP2012057487A | 2012-03-22 | |||
| JP2001255238A | 2001-09-21 |
Attorney, Agent or Firm:
SAKAI, HIROAKI (JP)
Hiroaki Sakai (JP)
Hiroaki Sakai (JP)
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