Title:
INSPECTION DEVICE AND INSPECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2015/181844
Kind Code:
A1
Abstract:
This inspection device is provided with: a supply means (7) which sequentially supplies objects to be inspected (2) loaded from a loading port of a supply device; a conveyance means which sequentially conveys with a conveyor (3) the objects to be inspected (2); a selection means which is provided with a brush roller (4) comprising a brush (20) attached to the outer circumferential surface of a roller body (19) and with a drive unit (18) which rotates the brush roller (4) in the direction opposite of the conveyance direction, forcing out the conveyed objects to be detected (2) that are positioned on top of other objects to be detected and excluding these from being inspected; and an inspection means which inspects the objects to be inspected (2) not forced out by the brush roller (4). By means of this configuration, it is possible to ensure that along the entire width direction of the conveyor, no objects to be detected are stacked on top of each other.
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Inventors:
TANI ATSUSHI (JP)
Application Number:
PCT/JP2014/002751
Publication Date:
December 03, 2015
Filing Date:
May 26, 2014
Export Citation:
Assignee:
FUTEC ORIGIN CORP (JP)
International Classes:
B65G47/28; B07C5/02
Foreign References:
| JPS492389U | 1974-01-10 | |||
| JPS52134395U | 1977-10-12 | |||
| JPH0797033A | 1995-04-11 |
Attorney, Agent or Firm:
YAMAUCHI PATENT ATTORNEYS (JP)
Patent business corporation Yamauchi patent firm (JP)
Patent business corporation Yamauchi patent firm (JP)
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