Title:
INSPECTION DEVICE AND INSPECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2024/057644
Kind Code:
A1
Abstract:
The present invention improves the accuracy of visual inspection. An inspection device (1) comprises: an image processing unit (3) for performing image processing on a video image captured of an inspected object; an AI processing unit (4) for labeling a foreign object captured in a video image of an inspected object on the basis of a learning parameter that has been obtained by learning training data which is a combination of a video image captured of an inspected object and an indicator indicative of whether the inspected object is a non-defective item or a defective item; and a determination unit (7) for determining whether an inspected object is a non-defective item or a defective item on the basis of the video image that has been processed by the image processing unit (3) and a video image that has been labeled by the AI processing unit (4).
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Inventors:
KATANE TADAHIRO (JP)
SODEYAMA ATSUFUMI (JP)
KIRIU NOZOMU (JP)
TSUSHIMA KAZUKI (JP)
SHINADA ISAO (JP)
KUSAKA TAKAHIRO (JP)
SODEYAMA ATSUFUMI (JP)
KIRIU NOZOMU (JP)
TSUSHIMA KAZUKI (JP)
SHINADA ISAO (JP)
KUSAKA TAKAHIRO (JP)
Application Number:
PCT/JP2023/022225
Publication Date:
March 21, 2024
Filing Date:
June 15, 2023
Export Citation:
Assignee:
HITACHI IND & CONTROL SOLUTIONS LTD (JP)
International Classes:
G01N21/88; G01N21/90; G06T7/00; G06V10/70
Foreign References:
| JP2021128406A | 2021-09-02 | |||
| JP2020187656A | 2020-11-19 | |||
| JP2020052044A | 2020-04-02 | |||
| JP2020041889A | 2020-03-19 | |||
| KR20220117092A | 2022-08-23 | |||
| CN112763506A | 2021-05-07 |
Attorney, Agent or Firm:
ISONO INTERNATIONAL PATENT OFFICE, P.C. (JP)
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