Title:
INSPECTION DEVICE AND PTP PACKAGING MACHINE
Document Type and Number:
WIPO Patent Application WO/2018/105149
Kind Code:
A1
Abstract:
Provided are an inspection device, and the like, that, while making it possible to prevent, for example, influence on inspection, make processing using ordinary image processing software possible, make it possible to include attribute information in image data for inspection, and make it possible to simplify data management and reduce processing load. This inspection device is provided with a quality determination means for determining the quality of a part to be inspected on the basis of image data for inspection that is data for an image for inspection of the part to be inspected. The image data for inspection includes data for each pixel corresponding to an area TA2 to be inspected that is the area to be subjected to the determination by the quality determination means and data for each pixel corresponding to an area TB2 not to be inspected that is an area other than the area TA2 to be inspected. The inspection device overwrites at least a portion of the pixel data corresponding to the area TB2 not to be inspected with attribute information relating to inspection.
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Inventors:
TAGUCHI YUKIHIRO (JP)
INOGUCHI TADASHI (JP)
INOGUCHI TADASHI (JP)
Application Number:
PCT/JP2017/021812
Publication Date:
June 14, 2018
Filing Date:
June 13, 2017
Export Citation:
Assignee:
CKD CORP (JP)
International Classes:
G01N21/892; B65B9/04; B65B57/00; B65B57/10; G01N21/85
Foreign References:
| JP2006219178A | 2006-08-24 | |||
| JP2014137281A | 2014-07-28 | |||
| JP2000163565A | 2000-06-16 | |||
| JP2004321458A | 2004-11-18 | |||
| US20140212006A1 | 2014-07-31 | |||
| US20150193900A1 | 2015-07-09 | |||
| JP2015200595A | 2015-11-12 | |||
| JP2011101138A | 2011-05-19 |
Other References:
See also references of EP 3553504A4
Attorney, Agent or Firm:
KAWAGUCHI Mitsuo (JP)
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