Title:
INSPECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2014/175413
Kind Code:
A1
Abstract:
In order to provide an inspection device which, when an image acquired by photographing an object to be inspected is subjected to image processing and defective forming is inspected, can prevent the object from being determined to be a defective item although the object is a non-defective item, the present invention is provided with: a model pattern positioning means (15) for performing pattern matching of a model pattern (M) on an image acquired by photographing an object to be inspected and positioning the model pattern (M) at a position where the degree of matching is highest; a model pattern subelement division means (16) for dividing the model pattern (M) into a plurality of subelements such that the subelements have mutually overlapping regions (D); and a shape recognition means (17) for, with a position when the model pattern (M) has been positioned on the image as a reference, performing pattern matching of each of the subelements divided by the model pattern subelement division means (16) within a determined range around the position, and positioning each of the subelements at a position where the degree of matching is highest to thereby recognize a shape corresponding to the model pattern (M) from the image.
Inventors:
FUJISAWA YOSHITAKA (JP)
Application Number:
PCT/JP2014/061664
Publication Date:
October 30, 2014
Filing Date:
April 25, 2014
Export Citation:
Assignee:
BRIDGESTONE CORP (JP)
International Classes:
G01B11/24; G01N21/956; G06T7/00; G06V10/75
Foreign References:
| JP2005331274A | 2005-12-02 | |||
| JPH09318555A | 1997-12-12 | |||
| JP2011509398A | 2011-03-24 | |||
| JP2006275952A | 2006-10-12 |
Other References:
See also references of EP 2990758A4
Attorney, Agent or Firm:
MIYAZONO Junichi et al. (JP)
Junichi Miyazono (JP)
Junichi Miyazono (JP)
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