Title:
INSPECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2017/056300
Kind Code:
A1
Abstract:
This inspection device reduces measurement error. This inspection device is provided with a component mounting unit, an attraction unit which attracts an electronic component to be mounted on the component mounting unit towards the component mounting unit, and multiple probes which are disposed so as to be capable of electrically connecting to each of multiple electrodes of the electronic component mounted on the component mounting unit. When the electronic component is mounted on the component mounting unit, the electronic component can be mounted on the component mounting unit in a suitable orientation because the electronic component is attracted by means of the attraction unit towards the component mounting unit. Consequently, measurement error is reduced in the measurement of electric properties of the electronic component.
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Inventors:
SAWADA TOSHIYUKI (JP)
Application Number:
PCT/JP2015/077982
Publication Date:
April 06, 2017
Filing Date:
October 01, 2015
Export Citation:
Assignee:
FUJI MACHINE MFG (JP)
International Classes:
G01R31/00
Foreign References:
| JPH10260214A | 1998-09-29 | |||
| JP2008308302A | 2008-12-25 |
Attorney, Agent or Firm:
KATAOKA, Tomoki (JP)
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