INSPECTION EQUIPMENT, VIBRATORY CONDITION DISPLAY, INSPECTION METHOD AND VIBRATORY CONDITION DISPLAYING METHOD - TOKYO UNIVERSITY OF AGRICULTURE AND TECHNOLOGY TLO CO., LTD.

Title:

INSPECTION EQUIPMENT, VIBRATORY CONDITION DISPLAY, INSPECTION METHOD AND VIBRATORY CONDITION DISPLAYING METHOD

Document Type and Number:

WIPO Patent Application WO/2005/083400

Kind Code:

A1

Abstract:

An inspection equipment (10) comprising a shaking table (12) for mounting an object (1) and imparting a vibration thereto, a camera (14) mounted on the shaking table (12) and picking up the image of the object (1) mounted on the shaking table (12) and imparted with a vibration, a computer (16), and a display (18). In the computer (16), a frequency distribution calculating section (16b) calculates the frequency distribution of luminance for each of a plurality of pixel cells constituting an image picked up by means of the camera (14), and an abnormality detecting section (16c) detects an abnormality of the object (1) and an abnormal position based on the frequency distribution of luminance for each of the plurality of pixel cells calculated at the frequency distribution calculating section (16b). Detection results from the abnormality detecting section (16c) are displayed on the display (18). According to the arrangement, the inspection equipment (10) can detect even a concealed structural defect which cannot be found externally.

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Inventors:

Ishii, Idaku (#204, 7-10 Minaga 3-chom, Higashihiroshima-shi Hiroshima 26, 73900, JP)

Application Number:

PCT/JP2004/002494

Publication Date:

September 09, 2005

Filing Date:

March 01, 2004

Export Citation:

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Assignee:

TOKYO UNIVERSITY OF AGRICULTURE AND TECHNOLOGY TLO CO., LTD. (24-16, Naka-cho 2-chome Koganei-shi, Tokyo 88, 18485, JP)
Ishii, Idaku (#204, 7-10 Minaga 3-chom, Higashihiroshima-shi Hiroshima 26, 73900, JP)

International Classes:

G01H9/00; G01M7/00; G01N21/88; G06T1/00; G01H9/00; G01M7/00; G01N21/88; G06T1/00; (IPC1-7): G01N21/88; G01H9/00; G01M7/00; G06T1/00

Attorney, Agent or Firm:

Hasegawa, Yoshiki (Soei Patent and Law Firm, Ginza First Bldg. 10-6, Ginza 1-chom, Chuo-ku Tokyo 61, 10400, JP)

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