Title:
INSPECTION IMAGE DISPLAY SYSTEM AND INSPECTION IMAGE DISPLAY METHOD
Document Type and Number:
WIPO Patent Application WO/2024/003965
Kind Code:
A1
Abstract:
This inspection image display system comprises: an information acquisition unit that acquires mounting information including positional information that represents the relative positional relationship between a component mounting tool that performs mounting operation to mount a component at a predetermined mounting position set on a substrate and the component held by the component mounting tool, the positional information being used to correct the position of the component mounting tool when performing the mounting operation; an image acquisition unit that acquires an inspection image by capturing an image of the substrate on which the component is mounted; and an image display unit that diagrammatizes the mounting information and overlays the result on the inspection image to display same.
Inventors:
ONO KEIICHI (JP)
KOTANI KAZUYA (JP)
KOBAYASHI TAKAHIRO (JP)
FUJIMOTO TOMOYA (JP)
KOTANI KAZUYA (JP)
KOBAYASHI TAKAHIRO (JP)
FUJIMOTO TOMOYA (JP)
Application Number:
PCT/JP2022/025434
Publication Date:
January 04, 2024
Filing Date:
June 27, 2022
Export Citation:
Assignee:
FUJI CORP (JP)
International Classes:
H05K13/08
Domestic Patent References:
| WO2018100717A1 | 2018-06-07 |
Attorney, Agent or Firm:
KYORITSU INTERNATIONAL (JP)
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