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Patent Searching and Data


Title:
INSPECTION INFORMATION PROCESSING METHOD, INSPECTION INFORMATION PROCESSING DEVICE, COMPUTER PROGRAM, AND LEARNING MODEL
Document Type and Number:
WIPO Patent Application WO/2020/059491
Kind Code:
A1
Abstract:
Provided are an inspection information processing method, an inspection information processing device, a computer program, and a learning model, which utilize inspection results with an easy method. This inspection information processing method includes processing for: receiving an absorbance value which was transmitted through a communication medium and which was obtained using an absorbance meter that measures the coloration or the discoloration appearing due to a reaction with a specific reagent of a substance to be detected included in an inspection object; determining, on the basis of the acquired absorbance value, the presence/absence of the substance to be detected included in the inspection object, or the concentration thereof; determining a handling method for the inspection object on the basis of the determination results; and transmitting the determined handling method.

Inventors:
KANEZAKI YUSUKE (JP)
TOMONO JUN (JP)
Application Number:
PCT/JP2019/034757
Publication Date:
March 26, 2020
Filing Date:
September 04, 2019
Export Citation:
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Assignee:
KANEKA CORP (JP)
International Classes:
G01N21/78
Domestic Patent References:
WO2018105432A12018-06-14
Foreign References:
JP2017125779A2017-07-20
JP2015114154A2015-06-22
JPH0679256A1994-03-22
CN107240089A2017-10-10
CN105912790A2016-08-31
JP2011153944A2011-08-11
JP2013532873A2013-08-19
CN106779418A2017-05-31
Attorney, Agent or Firm:
KOHNO, Hideto et al. (JP)
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