Title:
INSPECTION JIG AND PROBE EXCHANGE SYSTEM
Document Type and Number:
WIPO Patent Application WO/2019/221076
Kind Code:
A1
Abstract:
Provided are an inspection jig and an inspection method using the same which make it possible to definitively contact the tip end of a wire probe to the terminal of a chip component. The inspection jig is equipped with: a wire probe 2, the tip end of which has a contact part 2a formed thereon which contacts an inspection site 11; a base plate 3 for holding the rear end side of the wire probe 2; and a support plate 5 which is positioned above the inspection site 11 and has a through-hole 4 formed therein through which the tip end side of the wire probe 2 held by the base plate 3 passes. Therein, the wire probe 2, when a load is applied thereto, bends between the inspection site 11 and the support plate 5.
Inventors:
UTSUMI MASATO (JP)
Application Number:
PCT/JP2019/018986
Publication Date:
November 21, 2019
Filing Date:
May 13, 2019
Export Citation:
Assignee:
WIT CO LTD (JP)
International Classes:
G01R1/073
Domestic Patent References:
| WO2011115082A1 | 2011-09-22 |
Foreign References:
| US20150061713A1 | 2015-03-05 | |||
| US20130285688A1 | 2013-10-31 | |||
| JP2004226270A | 2004-08-12 | |||
| JP2007203332A | 2007-08-16 | |||
| JPH0921828A | 1997-01-21 | |||
| JP2011053035A | 2011-03-17 | |||
| JPH06230033A | 1994-08-19 |
Attorney, Agent or Firm:
NOGUCHI, Nobuhiro (JP)
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