INSPECTION LINE - SYSTEM SQUARE INC

Title:

INSPECTION LINE

Document Type and Number:

WIPO Patent Application WO/2019/146235

Kind Code:

A1

Abstract:

The objective of the present invention is to provide an inspection line provided with an inspecting device characterized by using a simple structure and simple control to inspect an inspection object. The inspection line is provided with: a radiating unit which radiates X-rays onto an inspection object inside an inspection target region; a detecting unit which detects an intensity distribution of X-rays that have been transmitted through the inspection object; a control unit which generates an X-ray transmission image of the inspection object on the basis of the X-ray intensity distribution detected by the detecting unit, and determines acceptance or rejection of the inspection object on the basis of the generated X-ray transmission image; and a conveying unit which causes the inspection object to pass through the inspection target region, distributes the inspection object as an accepted inspection object or a rejected inspection object in accordance with the acceptance or rejection determination result from the control unit, and conveys rejected inspection objects to an operating platform for an operation to be performed with respect to the inspection object, without passing the rejected inspection object through the inspection target region.

Inventors:

HASEGAWA ISAO (JP)
KANNO ATSUSHI (JP)
HATAKEYAMA TAKUYA (JP)

Application Number:

PCT/JP2018/043336

Publication Date:

August 01, 2019

Filing Date:

November 26, 2018

Export Citation:

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Assignee:

SYSTEM SQUARE INC (JP)

International Classes:

G01N23/04; G01N23/18

Foreign References:

JP2014048178A	2014-03-17
JP2017138193A	2017-08-10
JPH06129957A	1994-05-13
JPH1071235A	1998-03-17
JPH09314068A	1997-12-09
JP2010286409A	2010-12-24
US20080083661A1	2008-04-10
JP2014048178A	2014-03-17

Other References: