Title:
INSPECTION METHOD FOR METALLIC PURIFIED LUMP, MANUFACTURING METHOD FOR HIGH-PURITY METAL INCLUDING SAME, AND USES FOR SAME
Document Type and Number:
WIPO Patent Application WO/2013/080606
Kind Code:
A1
Abstract:
An inspection method for a metallic purified lump, the method comprising: bringing a purified lump support into contact with a metal melt containing impurities; depositing a metallic purified lump of the metal melt on the surface of the purified lump support by means of solidification segregation; and carrying out an inspection of the quality of the metallic purified lump obtained, as determined by the concentration of impurities included in the metallic purified lump, on the basis of the condition of the surface of the outer peripheral surface of the metallic purified lump.
Inventors:
OISHI RYUICHI
NAGATA YOSHIHIKO
NAKANO TAKAHIRO
NAGATA YOSHIHIKO
NAKANO TAKAHIRO
Application Number:
PCT/JP2012/069998
Publication Date:
June 06, 2013
Filing Date:
August 06, 2012
Export Citation:
Assignee:
SHARP KK (JP)
OISHI RYUICHI
NAGATA YOSHIHIKO
NAKANO TAKAHIRO
OISHI RYUICHI
NAGATA YOSHIHIKO
NAKANO TAKAHIRO
International Classes:
C01B33/037; C30B29/06; G01N33/20; H01L31/04
Domestic Patent References:
| WO2009130786A1 | 2009-10-29 |
Foreign References:
| JPH05232104A | 1993-09-07 | |||
| JP2001021463A | 2001-01-26 | |||
| JPH0526803A | 1993-02-02 | |||
| JP2008303113A | 2008-12-18 | |||
| JP2001172729A | 2001-06-26 | |||
| JP2006027940A | 2006-02-02 |
Attorney, Agent or Firm:
NOGAWA, Shintaro et al. (JP)
Shintaro Nogawa (JP)
Shintaro Nogawa (JP)
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Claims:
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