Title:
INSPECTION METHOD FOR POLYIMIDE FILM, POLYIMIDE FILM MANUFACTURING PROCESS USING SAME, AND POLYIMIDE FILM MANUFACTURING EQUIPMENT
Document Type and Number:
WIPO Patent Application WO/2012/056697
Kind Code:
A1
Abstract:
The purpose of the present invention is to provide an inspection method by which the scale of linear expansion coefficient anisotropy of a polyimide film can be determined speedily, easily and nondestructively. In order to achieve the purpose, this inspection method for polyimide film includes: a step (A) of measuring optically the in-plane retardation (Re) of a polyimide film; a step (B) of measuring the scales (S1) of linear expansion coefficient anisotropy of film specimens consisting of a polyimide having the same composition as that of the polyimide film; a step (C) of grasping the correlation between in-plane retardation (Re) and scale (S1) of linear expansion coefficient anisotropy; and a step (D) of estimating the scale (S2) of linear expansion coefficient anisotropy of the polyimide film on the basis of the grasped correlation from the in-plane retardation (Re).
Inventors:
ONO YOSUKE
Application Number:
PCT/JP2011/005987
Publication Date:
May 03, 2012
Filing Date:
October 26, 2011
Export Citation:
Assignee:
MITSUI CHEMICALS INC (JP)
ONO YOSUKE
ONO YOSUKE
International Classes:
G01N25/16; G01N21/41
Domestic Patent References:
| WO2005087480A1 | 2005-09-22 |
Foreign References:
| JP2010111086A | 2010-05-20 | |||
| JP2008106141A | 2008-05-08 | |||
| JP2004231946A | 2004-08-19 | |||
| JP2008012776A | 2008-01-24 | |||
| JP2008137178A | 2008-06-19 | |||
| JPS61264028A | 1986-11-21 |
Attorney, Agent or Firm:
WASHIDA, KIMIHITO (JP)
Koichi Washida (JP)
Koichi Washida (JP)
Download PDF:
Claims: