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Patent Searching and Data


Title:
INSPECTION METHOD AND INSPECTION SYSTEM OF CURRENT COLLECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2017/145750
Kind Code:
A1
Abstract:
Provided are an inspection method and inspection system for a current collection device, the method and system making it possible to efficiently inspect a push-up pressure of a current collection device and, in case of abnormalities, to quickly discover such abnormalities. In the inspection method and inspection system of the current collection device, an inspection is conducted of the push-up pressure of a current collection part which is lowered to a standby position by a lowering command and raised by a raising command so as to contact an overhead wire in order to receive power. A first timing (t1) indicating the start of raising or lowering of the current collection part during the operation of a train, and a second timing (t2) indicating the end of raising or lowering of the current collection part, are detected; and evaluation of the push-up pressure of the current collection part is carried out on the basis of an operation time for raising or lowering calculated from the first timing and the second timing.

Inventors:
HORI KEIJI (JP)
SAEKI YUUTO (JP)
SATOH HIDEKI (JP)
AKAOGI TSUYOSHI (JP)
MITA HIKARU (JP)
Application Number:
PCT/JP2017/004488
Publication Date:
August 31, 2017
Filing Date:
February 08, 2017
Export Citation:
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Assignee:
HIGASHI NIPPON RYOKAKU TETSUDO (JP)
International Classes:
B60L3/00; B60L5/24; G01M17/08
Foreign References:
JP2001018692A2001-01-23
JPH0468401U1992-06-17
JPH07123505A1995-05-12
JPH03103002A1991-04-30
JP2002328063A2002-11-15
Attorney, Agent or Firm:
KOYO INTERNATIONAL PATENT FIRM (JP)
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