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Patent Searching and Data


Title:
INSPECTION PROGRAM, INSPECTION DEVICE, AND INSPECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2010/092670
Kind Code:
A1
Abstract:
Whether or not a tag which is attached to a pack and is circulated can be utilized is correctly judged. An inspection device acquires the measurement value by measuring the data reading quality of a tag at present and acquires identification information for identifying the destination of the tag. The inspection device reads the quality reference value corresponding to the destination of the tag whose the data reading quality has been measured from a storage section for storing quality reference value for determining the utilization lives of the tags in a plurality of environments where the tags can be circulated. If the acquired measurement value satisfies the quality reference value, the inspection device determines that the tag whose data reading quality has been measured can be utilized.

Inventors:
URITA SEIICHI (JP)
FURUKAWA EIJI (JP)
KUROSAKI ATSUSHI (JP)
Application Number:
PCT/JP2009/052239
Publication Date:
August 19, 2010
Filing Date:
February 10, 2009
Export Citation:
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Assignee:
FUJITSU LTD (JP)
URITA SEIICHI (JP)
FURUKAWA EIJI (JP)
KUROSAKI ATSUSHI (JP)
International Classes:
G06K17/00; G06Q10/00; G06Q50/00
Foreign References:
JP2007199938A2007-08-09
JP2007179429A2007-07-12
JP2004217426A2004-08-05
JP2008532877A2008-08-21
Attorney, Agent or Firm:
SAKAI, HIROAKI (JP)
Hiroaki Sakai (JP)
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