Title:
INSPECTION SYSTEM, INSPECTION DEVICE, AND INSPECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2024/043006
Kind Code:
A1
Abstract:
This inspection device, which is used in an inspection system provided with an infrared camera, comprises: an input circuit for receiving image data; and a computation circuit for analyzing the image data. Using infrared rays emitted from a welding object after welding, the infrared camera acquires a plurality of temperature images each indicating the temperature of the welding object, and generates the image data which represents the plurality of temperature images. The plurality of temperature images are captured in time series in accordance with temperature changes in the welding object, and are reflective of changes in thermal conduction due to the internal structure of the welding object. The computation circuit: calculates an analysis image pertaining to the internal structure of the welding object on the basis of the image data; and, according to a difference in emissivity from respective surface parts of the welding object and on the basis of the contrast in at least one temperature image, extracts, in the analysis image, an inspection region corresponding to a welding region formed on the welding object by welding, and outputs the extracted inspection region.
Inventors:
IRIE YOUSUKE
Application Number:
PCT/JP2023/027859
Publication Date:
February 29, 2024
Filing Date:
July 28, 2023
Export Citation:
Assignee:
PANASONIC IP MAN CO LTD (JP)
International Classes:
G01N25/72
Foreign References:
| JP2003065985A | 2003-03-05 | |||
| JP2016142567A | 2016-08-08 | |||
| JP2015064311A | 2015-04-09 | |||
| JPH08122051A | 1996-05-17 | |||
| US5250809A | 1993-10-05 | |||
| JP2022178583A | 2022-12-02 |
Attorney, Agent or Firm:
YAMAO, Norihito et al. (JP)
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