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Patent Searching and Data


Title:
INSPECTION SYSTEM AND INSPECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2019/083009
Kind Code:
A1
Abstract:
An inspection system (1) having a hollow inspection head (10) which extends in a rod shape along a center axis (11), a rotation unit (20) which rotates the inspection head around the center axis (11), an optical system (30) which supplies a laser beam for inspection along the center axis (11) through the interior of the inspection head (10), and receives reflected light from the surface (4) of an inspection target (2) which is returned along the center axis, and an optical element (50) which is positioned at or near the tip of the inspection head, emits the laser beam for inspection toward the inspection target, and guides the reflected light in the center axis direction, wherein the optical element has a reflection surface capable of tilting in a manner such that the normal line thereof relative to the center axis forms an angle θ, and the angle θ satisfies the condition of 46°≤θ≤55°.

Inventors:
SATO SHINGO (JP)
HASEGAWA DAICHI (JP)
YAMAURA KENYA (JP)
Application Number:
PCT/JP2018/039845
Publication Date:
May 02, 2019
Filing Date:
October 26, 2018
Export Citation:
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Assignee:
NAGANO AUTOMATION CO LTD (JP)
International Classes:
G01N21/84; G01N21/954; G02B23/24; G02B23/26
Foreign References:
JP2005164398A2005-06-23
JPS5965708A1984-04-14
JP2005128527A2005-05-19
JPH11281331A1999-10-15
JP2001519026A2001-10-16
US20110080588A12011-04-07
Attorney, Agent or Firm:
IMAI, Akira (JP)
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