Title:
INSPECTION SYSTEM AND INSPECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2021/145141
Kind Code:
A1
Abstract:
This inspection system inspects a solar-power-generating device that has an array, and a tracking device that changes the orientation of the array according to the movement of the sun, the inspection system comprising: a flight device, an imaging unit, a calculation unit, and a control unit. The flight device can fly and hover. The imaging unit is provided in the flight device, performs an aerial shoot of the array from a first position, and acquires a first image. The calculation unit calculates orientation information related to the orientation of the array on the basis of the first image. The control unit performs a first flight control that flies the flight device to the first position, and a second flight control that, based on the orientation information, brings the flight device closer to the array than the first position.
Inventors:
ABIKO YOSHIYA (JP)
IWASAKI TAKASHI (JP)
KOGETSU YOSHIKAZU (JP)
MIKAMI RUI (JP)
IYATANI KAZUSHI (JP)
TAMURA SHINJI (JP)
SUGIYAMA KAIJI (JP)
YAMAMOTO SEIJI (JP)
SAITO KENJI (JP)
IWASAKI TAKASHI (JP)
KOGETSU YOSHIKAZU (JP)
MIKAMI RUI (JP)
IYATANI KAZUSHI (JP)
TAMURA SHINJI (JP)
SUGIYAMA KAIJI (JP)
YAMAMOTO SEIJI (JP)
SAITO KENJI (JP)
Application Number:
PCT/JP2020/047488
Publication Date:
July 22, 2021
Filing Date:
December 18, 2020
Export Citation:
Assignee:
SUMITOMO ELECTRIC INDUSTRIES (JP)
International Classes:
H02S10/00; H02S50/00
Foreign References:
| KR101541285B1 | 2015-08-03 | |||
| KR101660456B1 | 2016-09-28 | |||
| JP2019053024A | 2019-04-04 |
Attorney, Agent or Firm:
SUNCREST PATENT AND TRADEMARK ATTORNEYS (JP)
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