Title:
INSPECTION SYSTEM
Document Type and Number:
WIPO Patent Application WO/2020/218066
Kind Code:
A1
Abstract:
[Problem] To make it possible to automate inspection of an object by using a flying object. [Solution] An inspection system includes: a capturing information receiving unit for receiving an image of an object to be inspected that has been captured by a flying object provided with a camera, a capturing altitude of the flying object, and a capturing position of the flying object on a map; an abnormality detection unit for detecting an abnormality of the object to be inspected by analyzing the image; an abnormality position calculation unit for calculating an abnormality position of the object to be inspected on the map on the basis of a detection position, a capturing altitude, and a capturing position on an image in which an abnormality has been detected; and an abnormality information storage unit for storing abnormality information relating to an abnormality including at least the abnormality position in association with information identifying the abnormality. The abnormality information storage unit, upon determining that, with respect to a pair of each item of abnormality information stored in the abnormality information storage unit and another, different abnormality information, both abnormalities are identical, further stores abnormality information relating to the identical abnormalities in association with information identifying the identical abnormalities.
Inventors:
TAKAHASHI KAZUYA (JP)
OKAMURA SATOSHI (JP)
OKAMURA SATOSHI (JP)
Application Number:
PCT/JP2020/016329
Publication Date:
October 29, 2020
Filing Date:
April 13, 2020
Export Citation:
Assignee:
SENSYN ROBOTICS INC (JP)
International Classes:
B64C39/02; B64D47/08; G01N21/88; G01V8/10
Domestic Patent References:
WO2015163107A1 | 2015-10-29 |
Foreign References:
JP2010127748A | 2010-06-10 | |||
US20120262708A1 | 2012-10-18 | |||
US20160328835A1 | 2016-11-10 |
Attorney, Agent or Firm:
ONE IP PATENT FIRM (JP)
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