Title:
INSPECTION UNIT AND INSPECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2019/171797
Kind Code:
A1
Abstract:
This inspection unit comprises a first inspection tool and second inspection tool that are disposed so as to be aligned in a first direction and that each have: a contact element having formed, on the ends thereof, a first contact part capable of touching an object of inspection and a second contact part capable of touching an inspection device; and a housing for accommodating therein the contact element in a state where the first contact part is exposed to the outside. At least one from among the first inspection tool and second inspection tool is disposed so as to be capable of being moved along the first direction. Moving at least one from among the first inspection tool and second inspection tool along the first direction in a state in which an object of inspection has been brought close to the first contact parts from a second direction causes the first contact parts to come into contact with the object of inspection from the first direction.
Inventors:
SASANO NAOYA (JP)
TERANISHI HIROTADA (JP)
SAKAI TAKAHIRO (JP)
CHOI SI HUN (KR)
TERANISHI HIROTADA (JP)
SAKAI TAKAHIRO (JP)
CHOI SI HUN (KR)
Application Number:
PCT/JP2019/001829
Publication Date:
September 12, 2019
Filing Date:
January 22, 2019
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
G01R31/28; G01R1/06; G01R1/067; G01R1/073; H01R43/00
Foreign References:
JPH0581721U | 1993-11-05 | |||
JPS5786469U | 1982-05-28 | |||
JP2002374684A | 2002-12-26 | |||
JPS5011673A | 1975-02-06 | |||
JPH0416367U | 1992-02-10 |
Attorney, Agent or Firm:
YAMAO, Norihito et al. (JP)
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