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Patent Searching and Data


Title:
INSTRUMENT FOR MEASURING PHYSICAL PROPERTY OF SAMPLE
Document Type and Number:
WIPO Patent Application WO/2001/061323
Kind Code:
A1
Abstract:
An instrument for measuring a physical property of a sample by optically detecting the response of the sample to projection of an ultra-short optical pulse. A Sagnac common-path optical interferometer for measuring a physical property at a vertical input angle is provided. The interferometer is a one-arm Sagnac type and has two beam splitters. A sample (14) is excited by an ultra-short optical pulse, and changes of the strength and phase of the optical beam caused by the excitation are measured. Therefore it is possible to measure a physical property in a wide range such as the thickness of an object, a sound speed, or a thermal property.

Inventors:
WRIGHT OLIVER (JP)
HURLEY DAVID (US)
MATSUDA OSAMU (JP)
Application Number:
PCT/JP2000/004033
Publication Date:
August 23, 2001
Filing Date:
June 21, 2000
Export Citation:
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Assignee:
JAPAN SCIENCE & TECH CORP (JP)
WRIGHT OLIVER (JP)
HURLEY DAVID (US)
MATSUDA OSAMU (JP)
International Classes:
G01B11/02; G01B11/06; G01B9/02; G01D5/26; G01J11/00; G01N21/45; G01N25/16; G01N29/00; G01J9/02; (IPC1-7): G01N21/45; G01B11/06
Foreign References:
JPH05172739A1993-07-09
JPH049641A1992-01-14
JPH11511240A1999-09-28
Other References:
See also references of EP 1172643A4
Attorney, Agent or Firm:
Shimizu, Mamoru (Kanda-mitoshiro-cho Chiyoda-ku Tokyo, JP)
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