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Patent Searching and Data


Title:
INSTRUMENTED INDENTATION TEST DEVICE
Document Type and Number:
WIPO Patent Application WO/2020/171502
Kind Code:
A1
Abstract:
Embodiments of the present invention provide an instrumented indentation test device which, when installed at an object to be tested and performing an indentation test of the object, can measure indentation depth without slippage of a displacement sensor even when the surface of the object to be tested has a curvature, can be easily installed in a chamber for providing a high-temperature environment with a specimen, and can improve the accuracy and precision of the displacement sensor.

Inventors:
KIM KWANG HO (KR)
CHANG HEE KWANG (KR)
JI JEONG HYUN (KR)
SUNG JUN HO (KR)
Application Number:
PCT/KR2020/002222
Publication Date:
August 27, 2020
Filing Date:
February 17, 2020
Export Citation:
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Assignee:
FRONTICS INC (KR)
International Classes:
G01N3/14; G01B5/18
Foreign References:
KR20110057475A2011-06-01
JP2006250557A2006-09-21
KR20160118427A2016-10-12
JP2010014404A2010-01-21
KR102031197B12019-11-08
Attorney, Agent or Firm:
YUIL HIGHEST INTERNATIONAL PATENT AND LAW FIRM (KR)
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