INTERFACE FAILURE RATE MEASUREMENT DEVICE AND INTERFACE FAILURE RATE MEASUREMENT METHOD

Title:

INTERFACE FAILURE RATE MEASUREMENT DEVICE AND INTERFACE FAILURE RATE MEASUREMENT METHOD

Document Type and Number:

WIPO Patent Application WO/2024/024870

Kind Code:

A1

Abstract:

Provided are an interface failure rate measurement device and an interface failure rate measurement method for measuring an interface failure rate with high accuracy.　An interface failure rate measurement device (100) comprises: a light source part (50) that irradiates an adhesion breakage surface (40) with light (51); an imaging part (60) that captures an image of an adhesive agent residue (31) included in the adhesion breakage surface (40); and an image processing means (70) that determines an interface failure portion from the captured image and calculates the area proportion.

More Like This:

JPH0634520	METHOD FOR EVALUATING ANCHOR FORCE OF ADHESION TAPE OR SHEET
JP4700587	Test condition determination method and test method for adhesion performance of titanium-based hard coat to lens base material
JP4717156	Peeling test equipment

Inventors:

SATO CHIAKI (JP)
MATSUO GOH (JP)
KAKEI YUSHIN (JP)
SEKIGUCHI YU (JP)
NAITO MASANOBU (JP)

Application Number:

PCT/JP2023/027482

Publication Date:

February 01, 2024

Filing Date:

July 27, 2023

Export Citation:

Click for automatic bibliography generation Help

Assignee:

TOKYO INST TECH (JP)
NAT INST MATERIALS SCIENCE (JP)

International Classes:

G01N19/04

Domestic Patent References:

WO2021193609A1

2021-09-30

Foreign References:

JPH05331438A	1993-12-14
JP2018181204A	2018-11-15
JP2002000548A	2002-01-08
JP2001091850A	2001-04-06
JP2022107877A	2022-07-25
JPH08327498A	1996-12-13

Attorney, Agent or Firm:

IEIRI Takeshi (JP)

Download PDF:

View/Download PDF PDF Help

Previous Patent: METHOD FOR PRODUCING CHLOROFLUOROBUTANE (CFB)

Next Patent: METHOD FOR PRODUCING 1,2,3,4-TETRACHLORO-1,1,2,3,4,4-HEXAFLUOROBUTANE