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Patent Searching and Data


Title:
INTERFEROMETER, FOURIER TRANSFORM SPECTROSCOPIC DEVICE, AND COMPONENT ANALYZING DEVICE
Document Type and Number:
WIPO Patent Application WO/2019/008964
Kind Code:
A1
Abstract:
Provided are an interferometer, a Fourier transform spectroscopic device and a component analyzing device which are highly resistant to vibration, are inexpensive and compact, and have a high resolution. An interferometer 10 is provided with: a first polarizing element 13 which allows certain polarized light among incident light to pass; a birefringent crystal 14 which is arranged downstream of the first polarizing element 13 and is arranged rotatably about an axis of rotation in the incident direction of light emitted from the first polarizing element 13; a second polarizing element 15 which is arranged downstream of the birefringent crystal 14 and which allows certain polarized light among the light emitted from the birefringent crystal 14 to pass; and a light receiving element 17 which is arranged downstream of the second polarizing element 15 and which converts the light emitted from the second polarizing element 15 into an electrical signal; wherein the first polarizing element 13, the birefringent crystal 14, the second polarizing element 15 and the light receiving element 17 are arranged in a straight line.

Inventors:
FURUKAWA, Hiromitsu (Tsukuba Central 1 1-1, Umezono 1-Chome, Tsukuba-sh, Ibaraki 60, 〒3058560, JP)
Application Number:
JP2018/021192
Publication Date:
January 10, 2019
Filing Date:
June 01, 2018
Export Citation:
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Assignee:
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY (3-1 Kasumigaseki 1-chome, Chiyoda-ku Tokyo, 21, 〒1008921, JP)
International Classes:
G01J3/45; G01B9/02; G01N21/35
Attorney, Agent or Firm:
INABA, Yoshiyuki et al. (TMI ASSOCIATES, 23rd Floor Roppongi Hills Mori Tower, 6-10-1, Roppongi, Minato-k, Tokyo 23, 〒1066123, JP)
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