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Patent Searching and Data


Title:
INTERFEROMETER, AND SPECTROMETER PROVIDED WITH SAME
Document Type and Number:
WIPO Patent Application WO/2013/008580
Kind Code:
A1
Abstract:
In the present invention a light path of a measuring light emitted from a measuring light source and a light path of a reference light emitted from a reference light source are superimposed by a beam combiner. The measuring light emitted from the measuring light source includes light from a sensitive wavelength region (S1) of a measuring light detector, and light from a sensitive wavelength region (S2) of a reference light detector. An interferometer is provided with a wavelength separation filter for filtering, from among the light included in the wavelength region of the measuring light, at least some of the light from the sensitive wavelength region (S2) of the reference light detector.

Inventors:
HIRAO YUSUKE (JP)
Application Number:
PCT/JP2012/065262
Publication Date:
January 17, 2013
Filing Date:
June 14, 2012
Export Citation:
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Assignee:
KONICA MINOLTA HOLDINGS INC (JP)
HIRAO YUSUKE (JP)
International Classes:
G01J3/45
Foreign References:
JPH1183737A1999-03-26
JP2009511921A2009-03-19
JPH08292266A1996-11-05
JPH063401B21994-01-12
JPH08338763A1996-12-24
Attorney, Agent or Firm:
SANO SHIZUO (JP)
Shizuo Sano (JP)
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Claims: