Title:
INTERREFLECTION DETECTION DEVICE, INTERREFLECTION DETECTION METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2018/163537
Kind Code:
A1
Abstract:
Provided is an interreflection detection device comprising: an radiation means that radiates light of variable-frequency sinusoidal wave patterns; an image acquisition means that acquires an image of an object irradiated with the light from the radiation means; a phase determination means that determines, from the image, the phase at each of multiple positions; and a detection means that detects a region in which interreflection is occurring. The detection means calculates, for a plurality of combinations of low frequency and high frequency, a phase difference between a phase obtained from an image acquired when radiating a low frequency sinusoidal wave pattern and a phase obtained from an image acquired when radiating a high frequency sinusoidal wave pattern, and determines that interreflection is occurring in a region in which the phase difference for one of the plurality of combinations is at or above a threshold.
Inventors:
OHNISHI YASUHIRO (JP)
Application Number:
PCT/JP2017/042601
Publication Date:
September 13, 2018
Filing Date:
November 28, 2017
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
G01B11/25
Foreign References:
| JP2008309551A | 2008-12-25 | |||
| JP2009019941A | 2009-01-29 | |||
| JP2014059261A | 2014-04-03 | |||
| JP2015132509A | 2015-07-23 | |||
| US20150330775A1 | 2015-11-19 | |||
| JP2008309551A | 2008-12-25 |
Other References:
See also references of EP 3594616A4
Attorney, Agent or Firm:
SEKINE, Takehiko et al. (JP)
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