Title:
ION ANALYSIS DEVICE
Document Type and Number:
WIPO Patent Application WO/2021/181628
Kind Code:
A1
Abstract:
An ion analysis device 1 for generating a product ion from a precursor ion derived from a sample component and analyzing the product ion, the ion analysis device 1 comprising: a reaction chamber 132 into which the precursor ion is introduced; a radical release body 134 which is arranged in the reaction chamber or a space communicating with the reaction chamber, has a surface that is at least partially oxidized or nitrogenized, and is made from a specific type of metal; a heating unit 20 for heating the radical release body to a predetermined temperature; and a separation detection unit 135,136 for separating and detecting a product ion generated from the precursor ion by the reaction of the precursor ion with radical generated from the radical release body that has been heated to the predetermined temperature depending on at least one of a mass-to-charge ratio and an ion mobility.
Inventors:
TAKAHASHI HIDENORI (JP)
Application Number:
PCT/JP2020/010915
Publication Date:
September 16, 2021
Filing Date:
March 12, 2020
Export Citation:
Assignee:
SHIMADZU CORP (JP)
International Classes:
G01N27/62; H01J49/14
Foreign References:
| JP2019056598A | 2019-04-11 | |||
| JP2017519207A | 2017-07-13 | |||
| US20150187557A1 | 2015-07-02 |
Attorney, Agent or Firm:
KYOTO INTERNATIONAL PATENT LAW OFFICE (JP)
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