Title:
ION SOURCE SYSTEM FOR ATMOSPHERIC PRESSURE INTERFACE, AND MASS SPECTROMETER
Document Type and Number:
WIPO Patent Application WO/2015/055128
Kind Code:
A1
Abstract:
Provided is an ion source system for an atmospheric pressure interface, comprising an atmospheric pressure ion source (1), the atmospheric pressure ion source (1) being connected downstream to a vacuum ion source (2). Also provided is a mass spectrometer, using the present ion source system as an ion source. The present ion source system uses a combination of the atmospheric pressure ion source (1) and the vacuum ion source (2), is suitable for test samples having a variety of forms, and performs secondary ionization on a sample to be tested, thus ensuring ion transmission efficiency. The present mass spectrometer significantly increases ion transmission efficiency, thus enabling continuous introduction of samples and testing, and increasing the scanning speed of the spectrometer, particularly suitable for miniaturized spectrometers.
Inventors:
XU WEI (CN)
BIAN CUNJUNA (CN)
ZHAI YANBING (CN)
FANG XIANG (CN)
XIONG XINGCHUANG (CN)
JIANG YOU (CN)
BIAN CUNJUNA (CN)
ZHAI YANBING (CN)
FANG XIANG (CN)
XIONG XINGCHUANG (CN)
JIANG YOU (CN)
Application Number:
PCT/CN2014/088733
Publication Date:
April 23, 2015
Filing Date:
October 16, 2014
Export Citation:
Assignee:
BEIJING INST TECHNOLOGY (CN)
International Classes:
H01J49/10
Foreign References:
| CN102800554A | 2012-11-28 | |||
| US20090039250A1 | 2009-02-12 | |||
| US20030155505A1 | 2003-08-21 | |||
| CN101713761A | 2010-05-26 |
Attorney, Agent or Firm:
BEIJING INTELLEGAL INTELLECTUAL PROPERTY AGENT LTD. (CN)
北京律智知识产权代理有限公司 (CN)
北京律智知识产权代理有限公司 (CN)
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