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Patent Searching and Data


Title:
ION SOURCE
Document Type and Number:
WIPO Patent Application WO/2020/095611
Kind Code:
A1
Abstract:
The purpose of the present invention is to improve safety and stability of an ion source by uniformizing the temperature distribution across a heating gas while ensuring thermal insulation properties. The ion source according to the present invention is provided with a gas inlet port that is disposed within a probe holding part for holding an ion probe, wherein a plurality of mutually independent pipes extending along the extension direction of the ion probe are provided for connecting between the gas inlet part and a heating part for raising the temperature of the heating gas.

Inventors:
HASEGAWA HIDEKI (JP)
SUGIYAMA MASUYUKI (JP)
HASHIMOTO YUICHIRO (JP)
Application Number:
PCT/JP2019/039937
Publication Date:
May 14, 2020
Filing Date:
October 10, 2019
Export Citation:
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Assignee:
HITACHI HIGH TECH CORP (JP)
International Classes:
H01J49/10
Foreign References:
JP2004028763A2004-01-29
JP2013190316A2013-09-26
JP2003517576A2003-05-27
JP2007066903A2007-03-15
US20050258358A12005-11-24
JPS6136773B21986-08-20
Other References:
See also references of EP 3879560A4
Attorney, Agent or Firm:
HIRAKI & ASSOCIATES (JP)
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