Title:
ION TRAP MASS ANALYSIS DEVICE AND MASS ANALYSIS METHOD
Document Type and Number:
WIPO Patent Application WO/2012/014828
Kind Code:
A1
Abstract:
Provided is an ion trap mass analysis device for MS/MS analysis in which the MS spectrum of only fragment information is obtained so that analysis can be performed in a short time. The ion trap mass analysis device is provided with: an ionization unit for ionizing a sample separated into each component; an ion trap unit for holding the ions ionized by the ionization unit in an electric field and also discharging the ions in accordance with the mass of the ions; a detection unit for detecting the ions discharged from the ion trap unit; and a processing unit for generating an MS spectrum (mass spectrum) on the basis of the data detected by the detection unit. The processing unit is constructed so as to obtain the MS spectrum of only the fragment information of the target ions from the difference between the MS spectra obtained by MS analyses executed before and after MS/MS analysis and the MS spectrum obtained by MS/MS analysis.
Inventors:
NISHIDA Tetsuya (HITACHI HIGH-TECHNOLOGIES CORPORATION 882, Oaza Ichige, Hitachinaka-sh, Ibaraki 04, 〒3128504, JP)
Application Number:
JP2011/066796
Publication Date:
February 02, 2012
Filing Date:
July 25, 2011
Export Citation:
Assignee:
HITACHI HIGH-TECHNOLOGIES CORPORATION (24-14, Nishi Shimbashi 1-chome Minato-k, Tokyo 17, 〒1058717, JP)
株式会社日立ハイテクノロジーズ (〒17 東京都港区西新橋一丁目２４番１４号 Tokyo, 〒1058717, JP)
株式会社日立ハイテクノロジーズ (〒17 東京都港区西新橋一丁目２４番１４号 Tokyo, 〒1058717, JP)
International Classes:
G01N27/62
Attorney, Agent or Firm:
POLAIRE I.P.C. (7-1 Hatchobori 2-chome, Chuo-ku Tokyo, 32, 〒1040032, JP)
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